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Электронный компонент: UPD75P316B

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4-BIT SINGLE-CHIP MICROCOMPUTER
MOS INTEGRATED CIRCUIT
Document No. IC-3189
The mark 5
shows the major revised points.
(O.D. No. IC-8696)
Date Published January 1994P
Printed in Japan
NEC Corporation 1994
PD75P316B
DESCRIPTION
The
PD75P316B is a product of the
PD75316B with its built-in ROM having been replaced with the one-
time PROM.
It is most suitable for test production during system development and for production in small amounts since
it can operate under the same supply voltage as mask products.
The one-time PROM product is capable of writing only once and is effective for production of many kinds of
sets in small quantities and early startup.
The EPROM product allows programs to be written and rewritten, making it ideal for system evaluation.
Functions are described in detail in the following User'S Manual, which should be read when carrying out
design work.
PD75308 User's Manual: IEM-5016
FEATURES
Compatible (excluding mask option) with the
PD75312B/75316B (mask products)
Memory capacity
Program memory (PROM) : 16256
8 bits
Data memory (RAM)
: 1024
4 bits
Ideal for small set as camera, etc.
DATA SHEET
ORDERING INFORMATION
Ordering Code
Package
Internal ROM
Quality Grade
PD75P316BGC-3B9
80-pin plastic QFP (
s
s
14 mm)
One-time PROM
Standard
PD75P316BGK-BE9
80-pin plastic QFP (fine pitch) (
s
s
12 mm)
One-time PROM
Standard
PD75P316BKK-T*
80-pin ceramic WQNF (LCC with window)
EPROM
Not applicable
(for function evaluation)
*
Under Development
Please refer to "Quality grade on NEC Semiconductor Devices" (Document number IEI-1209) published by
NEC Corporation to know the specification of quality grade on the devices and its recommended applications.
The information in this document is subject to change without notice.
The
PD75P316B EPROM product does not provide a level of reliability suitable for use as a
volume production product for customers' devices. The EPROM product should be used solely for
function evaluation in experiments or preproduction.
In descriptions common to one-time PROM products and EPROM products in this document, the term
"PROM" is used.
PD75P316B
2
PIN CONFIGURATION (Top View)
80-pin plastic QFP (
s
s
14 mm)
80-pin plastic TQFP (fine pitch)(
s
s
12 mm)
80-pin ceramic WQFN (LCC with window)
*
In normal operation, V
PP
input should be the V
DD
level.
P00-03
: Port 0
V
LC0-2
: LCD Power Supply 0-2
P10-13
: Port 1
BIAS
: LCD Power Supply Bias Control
P20-23
: Port 2
LCDCL
: LCD Clock
P30-33
: Port 3
SYNC
: LCD Synchronization
P40-43
: Port 4
TI0
: Timer Input 0
P50-53
: Port 5
PTO0
: Programmable Timer Output 0
P60-63
: Port 6
BUZ
: Buzzer Clock
P70-73
: Port 7
PCL
: Programmable Clock
BP0-7
: Bit Port
INT0, 1, 4
: External Vectored Interrupt 0, 1, 4
KR0-7
: Key Return
INT2
: External Test Input 2
SCK
: Serial Clock
X1, 2
: Main System Clock Oscillation 1, 2
SI
: Serial Input
XT1, 2
: Subsystem Clock Oscillation 1, 2
SO
: Serial Output
MD0-3
: Mode Selection
SB0, 1
: Serial Bus 0, 1
V
DD
: Positive Power Supply
RESET
: Reset Input
V
SS
: Ground
S0-31
: Segment Output 0-31
V
PP
: Programing/Verifying Power
COM0-3 : Common Output 0-3
1
2
3
4
5
6
7
8
9
10
11
13
14
15
16
17
18
19
20
12
S31/BP7
8079787776 757473 7271 70696867666564636261
60
59
58
57
56
55
54
53
52
51
50
48
47
46
45
44
43
42
41
49
2122232425 262728 2930 31323334353637383940
S19
S23
S22
S21
P60/KR0
P33/MD3
P32/MD2
P31/SYNC/MD1
P30/LCDCL/MD0
P23/BUZ
P22/PCL
P21
P20/PTO0
P13/TI0
P12/INT2
P11/INT1
P10/INT0
P03/SI/SB1
COM0
COM1
COM2
COM3
BIAS
V
LC0
V
LC1
V
LC2
P40
P41
P42
P43
V
SS
P50
P51
P52
P53
P00/INT4
P01/SCK
P02/SO/SB0
S11
S2
S3
S10
S9
S8
S7
S6
S5
S4
S1
S0
RESET
P73/KR7
P72/KR6
P71/KR5
P70/KR4
P63/KR3
P62/KR2
P61/KR1
X2
X1
V
PP
*
XT2
XT1
V
DD
S30/BP6
S29/BP5
S28/BP4
S27/BP3
S26/BP2
S25/BP1
S24/BP0
S20
S18
S17
S16
S15
S14
S13
S12
PD75P316BGC-3B9
PD75P316BGK-BE9
PD75P316BKK-T
PD75P316B
3
m
BLOCK DIAGRAM
PROGRAM
COUNTER (14)
PROGRAM
MEMORY
(PROM)
16256
8 BITS
LCD
CONTROL-
LER
/DRIVER
S0-S23
S24/BP0
S31/BP7
COM0COM3
V
LC0
V
LC2
BIAS
LCDCL/P30
SYNC/P31
GENERAL REG.
DATA
MEMORY
(RAM)
1024
4 BITS
BANK
SP(8)
ALU
CY
DECODE
AND
CONTROL
BIT SEQ.
BUFFER (16)
4
P00-P03
4
P10-P13
4
P20-P23
4
P30-P33
/MD0-MD3
PORT4
4
P40-P43
PORT5
4
P50-P53
PORT6
4
P60-P63
PORT7
4
P70-P73
PORT3
PORT2
PORT1
PORT0
24
8
4
3
f
LCD
RESET
V
SS
V
DD
CPU
CLOCK
V
PP
STAND BY
CONTROL
SYSTEM CLOCK
GENERATOR
SUB
MAIN
CLOCK
DIVIDER
CLOCK
OUTPUT
CONTROL
X2
X1
XT2
XT1
PCL/P22
f
X
/ 2
N
BASIC
INTERVAL
TIMER
INTBT
TIMER/EVENT
COUNTER
#0
INTT0
TI0/P13
PTO0/P20
WATCH
TIMER
INTW
f
LCD
BUZ/P23
SERIAL BUS
INTERFACE
INTCSI
SCK/P01
SO/SB0/P02
SI/SB1/P03
INTERRUPT
CONTROL
KR0/P60
KR7/P73
INT4/P00
INT2/P12
INT1/P11
INT0/P10
8
PD75P316B
4
CONTENTS
1.
PIN FUNCTIONS .........................................................................................................................................
5
1.1
PORT PINS ........................................................................................................................................................... 5
1.2
OTHER PINS ......................................................................................................................................................... 7
1.3
PIN INPUT/OUTPUT CIRCUITS ......................................................................................................................... 9
2.
DIFFERENCES BETWEEN PRODUCTS IN SERIES ................................................................................
11
3.
DATA MEMORY (RAM) ............................................................................................................................
12
4.
PROGRAM MEMORY WRITE AND VERIFY ............................................................................................
14
4.1
PROGRAM MEMORY WRITE/VERIFY OPERATING MODES ....................................................................... 14
4.2
PROGRAM MEMORY WRITING PROCEDURE ............................................................................................... 15
4.3
PROGRAM MEMORY READING PROCEDURE ............................................................................................... 16
4.4
ERASURE PROCEDURE(
PD75P316BKK-T-ONLY) ........................................................................................ 17
5.
ELECTRICAL SPECIFICATIONS ...............................................................................................................
18
6.
PACKAGE INFORMATION .......................................................................................................................
39
7.
RECOMMENDED SOLDERING CONDITIONS ........................................................................................
42
APPENDIX A. DEVELOPMENT TOOLS .........................................................................................................
43
APPENDIX B. RELATED DOCUMENTS ........................................................................................................
44
PD75P316B
5
1.
PIN FUNCTIONS
1.1
PORT PINS (1/2)
Input
Input/output
Input/output
Input/output
Input
Input/output
Input/output
Input/output
Input/output
P00
P01
P02
P03
P10
P11
P12
P13
P20
P21
P22
P23
P30 *2
P31 *2
P32 *2
P33 *2
P40 to P43*2
P50 to P53 *2
P60
P61
P62
P63
P70
P71
P72
P73
Dual-Function
Pin
INT4
SCK
SO/SB0
SI/SB1
INT0
INT1
INT2
TI0
PTO0
--
PCL
BUZ
LCDCL MD0
SYNC
MD1
MD2
MD3
--
--
KR0
KR1
KR2
KR3
KR4
KR5
KR6
KR7
I/O Circuit
Type*1
B
F - A
F - B
M - C
B - C
E - B
E - B
M - A
M - A
F - A
F - A
Input
Input
Input
Input
High impedance
High impedance
Input
Input
4-bit input port (PORT0)
Internal pull-up resistor specification by
software is possible for P01 to P03 as a 3-bit
unit.
4-bit input port (PORT1)
Internal pull-up resistor specification by
software is possible as a 4-bit unit.
4-bit input/output port (PORT2)
Internal pull-up resistor specification by
software is possible as a 4-bit unit.
Programmable 4-bit input/output port (PORT3)
Input/output settable bit-wise.
Internal pull-up resistor specification by
software is possible as a 4-bit unit.
N-ch open-drain 4-bit input/output port (PORT
4).
Data input/output pins for program memory
(PROM) write/verify (low-order 4 bits).
N-ch open-drain 4-bit input/output port (PORT
5)
Data input/output pins for program memory
(PROM) write/verify (high-order 4 bits).
Programmable 4-bit input/output port (PORT6).
Input/output settable bit-wise.
Internal pull-up resistor specification by
software is possible as a 4-bit unit.
4-bit input/output port (PORT7).
Internal pull-up resistor specification by
software is possible as a 4-bit unit.
With noise elimination circuit
Pin Name
Input/Output
Function
8-bit I/O
Afer Reset
Input/output
Input/output
* 1.
: Indicates a Schmitt-triggered input.
2 .
Direct LED drive capability.
PD75P316B
6
1.1
PORT PINS (2/2)
BP0
BP1
BP2
BP3
BP4
BP5
BP6
BP7
Dual-
Function Pin
S24
S25
S26
S27
S28
S29
S30
S31
I/O Circuit
TYPE
G - C
*
1-bit output port (BIT PORT)
Dual-function as segment output pins.
Output
Output
Pin Name
Input/Output
Function
8-bit I/O
After Reset
*
For BP0 to BP7, V
LC1
is selected as the input source. The output level depends on BP0 to BP7 and the
V
LC1
external circuit, however.
5
PD75P316B
7
1.2
OTHER PINS
--
Input
Input
Input
Input
Input
Input
--
--
--
Input
Input
--
--
--
Input
--
--
--
External event pulse input pin for timer/event counter.
Timer/event counter output pin
Clock output pin
Fixed frequency output pin (for buzzer or system clock
trimming)
Serial clock input/output pin
Serial data output pin
Serial bus input/output pin
Serial data input pin
Serial bus input/output pin
Edge-detected vectored interrupt input pin (rising or
falling edge detection).
Edge-detected vectored interrupt input pin (detection
edge selectable)
Edge-detected testable input pin (rising edge detection)
Testable Input/output pins (parallel falling edge detection)
Testable Input/output pins (parallel falling edge detection)
Main system clock oscillation crystal/ceramic connection
pins. When an external clock is used, the clock is input
to X1 and the inverted clock to X2.
Subsystem clock oscillation crystal connection pins
When an external clock is used, the clock is input to XT1
and the inverted clock toXT2. XT1 can be used as a 1-bit
input (test) pin.
System reset input pin (low-level active).
Mode selection pin for program memory (PROM) write/
verify.
Program voltage application pin for program memory
(PROM) write/verify . Connected to V
DD
in normal
operation. Applies +12.5 V in program memory write/
verify.
Positive power supply pin
GND potential pin
Dual-
Function Pin
P13
P20
P22
P23
P01
P02
P03
P00
P10
P11
P12
P60 to P63
P70 to P73
--
--
--
P30 to P33
--
--
--
Pin Name
Input/Output
Function
After Reset
Input
output
Input/output
Input/output
Input/output
Input/output
Input/output
Input
Input
Input
Input/output
Input/output
Input
Input
Input
Input/output
--
--
--
I/O Circuit
Type
*1
B - C
E - B
E - B
E - B
F - A
F - B
M - C
B
B - C
B - C
F - A
F - A
--
--
B
E - B
--
--
--
S0 to S23
S24 to S31
COM0 to COM3
V
LC0
to V
LC2
BIAS
LCDCL*2
SYNC*2
Output
Output
Output
--
--
Input/output
Input/output
--
BP0 to 7
--
--
--
P30
P31
Segment signal output pins
Segment signal output pins
Common signal output pins
LCD drive power supply pins
External split cutting output pin
External extension driver drive clock output pin
External extension driver synchronization clock output
pin
*3
*3
*3
--
High impedance
Input
Input
G - A
G - A
G - B
--
--
E - B
E - B
TI0
PTO0
PCL
BUZ
SCK
SO/SB0
SI/SB1
INT4
INT0
INT1
INT2
KR0 to KR3
KR4 to KR7
X1, X2
XT1, XT2
RESET
MD0 to MD3
V
PP
V
DD
V
SS
PD75P316B
8
*
1.
: Indicates a Schmitt-triggered input.
2. Pins provided for future system expansion. Currently used only as pins 30 and 31.
3. V
LCX
shown below can be selected for display outputs.
S0 to S31: V
LC1
, COM0 to COM2: V
LC2
, COM3: V
LC0
However, display output levels depend on the display output and V
LCX
external circuit.
PD75P316B
9
1.3
PIN INPUT/OUTPUT CIRCUITS
The input/output circuits for each of the pin
PD75P316B are shown below in partially simplified form.
P-ch
V
DD
OUT
N-ch
data
output
disable
Schmitt-Trigger Input with Hysteresis Characteristic
P-ch
V
DD
IN
N-ch
P.U.R.
P-ch
IN/OUT
P.U.R.
enable
data
output
disable
Type D
Type A
P.U.R.:Pull-Up Resistor
V
DD
P.U.R.
P-ch
IN/OUT
P.U.R.
enable
data
output
disable
Type D
Type B
P.U.R.:Pull-Up Resistor
V
DD
CMOS Standard Input Buffer
Push-pull output that can be made high-impedance output
(P-ch and N-ch OFF)
TYPE A (For TYPE E-B)
TYPE D (For TYPE E-B, F-A)
TYPE B
TYPE E-B
TYPE F-A
TYPE B-C
IN
IN
P-ch
P.U.R.
P.U.R.
enable
V
DD
P.U.R. : Pull-Up Resistor
PD75P316B
10
N-ch
P-ch
OUT
SEG
data
P-ch
V
LC0
V
LC1
V
LC2
N-ch
V
LC0
V
LC1
V
LC2
COM
data
N-ch
P-ch
P-ch
N-ch
OUT
N-ch
P-ch
TYPE F-B
TYPE G-O
TYPE M-A
TYPE G-A
TYPE G-B
TYPE M-C
P.U.R.
IN/OUT
P.U.R.
enable
output
disable
(P)
output
disable
data
output
disable
(N)
V
DD
V
DD
P-ch
N-ch
P-ch
P.U.R.:Pull-Up Resistor
5
IN/OUT
N-ch
(+10 V
Withstand
Voltage)
data
output
disable
Middle-High Voltage Input Buffer
(+10 V Withstand Voltage)
N-ch
P-ch
OUT
P-ch
N-ch
V
DD
V
LC0
V
LC1
V
LC2
SEG data/
Bit Port data
P.U.R.
enable
IN/OUT
P-ch
V
DD
N-ch
data
output
disable
P.U.R.:Pull-Up Resistor
P.U.R.
PD75P316B
11
2. DIFFERENCES BETWEEN PRODUCTS IN SERIES
The
PD75P316B is a version of the
PD75316B with its built-in mask ROM replaced with the one-time PROM
or EPROM. When performing debugging or preproduction of an application system using PROM and then
volume production using a mask ROM product, etc., these differences should be taken into account in the
transition. Table 2-1 shows the differences from the other products in series.
For the details of the CPU functions and the built-in hardware, please refer to the
PD75308 User's Manual
(IEM-5016).
Product Name
Comparison Item
80-pin plastic QFP
(
s
s
14 mm)
80-pin plastic TQFP
(fine pitch)(
s
s
12 mm)
80-pin plastic QFP
(
s
s
14 mm)
80-pin plastic TQFP
(fine pitch)(
s
s
12 mm)
80-pin ceramic QWFN
(LCC with window)
Table 2-1 Differences between Products in Series
PD75P316A
PD75P316B
PD75312B/75316B
Program memory (bytes)
EPROM/one-time PROM
One-time PROM
Mask ROM
16256
EPROM
12160/16256
16256
Data memory (x 4 bits)
1024
Pull-up resistors of ports 4 and 5
None
Incorporation specifiable
by mask option
LCD driving power supplying split
None
Incorporation specifiable
resistor
by mask option
Pin connection
No.50 to 55
P30/MD0 to P33/MD3
P30 to P33
No.57
V
PP
IC
The mask ROM products and PROM products have different consumption
Electrical specifications
currents, etc. See the Electrical Specifications section in the relevant Data Sheets
for details.
Power supply voltage range
2.7 to 6.0 V
2.0 to 5.5 V
80-pin plastic QFP
(14
20 mm)
Package
80-pin ceramic WQNF
(LCC with window)
Other
The mask ROM products and PROM products have different circuit scales and
mask layouts, and therefore differ in terms of noise resistance and noise radiation.
*
Noise resistance and noise radiation differs between the PROM products and mask ROM products. When
investigating a switch from PROM product to mask PROM product in the transition from preproduction to
volume production, thorough evaluation should be carried out with the mask ROM CS product (not the ES
product).
5
5
5
5
PD75P316B
12
3.
DATA MEMORY (RAM)
Fig. 3-1 shows the data memory configuration. It consists of a data area and a peripheral hardware area.
The data area consists of memory banks 0 to 3 with each bank consisting of 256 words x 4 bits.
Peripheral hardware has been assigned to the area of memory bank 15.
(1)
Data area
The data area comprises a static RAM. It is used to store program data and as a subroutine, interrupt
execution stack memory. Even if the CPU operation is stopped in the standby mode, it is possible to hold the
memory content for a long time by battery backup, etc. The data area is operated by memory manipulation
instructions.
The static RAM has been mapped to memory banks 0, 1, 2 and 3 by 256 x 4 bits each. Bank 0 has been
mapped as a data area but is also available as a general register area (000H to 007H) and a stack area (000H
to 0FFH) (banks 1, 2 and 3 are available only as a data area).
In the static RAM, 1 address consists of 4 bits. It can be operated in units of 8 bits by 8-bit memory ma-
nipulation instructions or in bits by bit manipulation instructions, however. In an 8-bit manipulation instruc-
tion, an even address should be specified.
(a)
General register area
The general register area can be operated either by general register operation instructions or by memory
manipulation instructions. Up to eight 4-bit registers are available. That part of the 8 general registers
which is not used in the program is available as a data area or a stack area.
(b) Stack area
The stack area is set by an instruction. It is available as a subroutine execution or interrupt service
execution save area.
(2)
Peripheral hardware area
The peripheral hardware area has been mapped to F80H to FFFH of memory bank 15.
It is operated by memory manipulation instructions just as the static RAM. In the peripheral hardware,
however, the operable bit unit differs from one address to another. An address to which peripheral hardware
has not been assigned is inaccessible since no data memory is built in.
PD75P316B
13
Fig. 3-1 Data Memory Map
256
4
128
4
(8
4)
Data Memory
Not On-Chip
Memory Bank
F80H
FFFH
Peripheral Hardware Area
General
Register Area
3FFH
300H
2FFH
200H
1FFH
100H
0FFH
008H
007H
000H
Data Area
Static RAM
(1024
4)
Stack
Area
256
4
256
4
256
4
0
1
2
3
15
PD75P316B
14
4.
PROGRAM MEMORY WRITE AND VERIFY
The ROM built into the
PD75P316B is a 16256 x 8-bit electrically writable one-time PROM. The table below
shows the pins used to program this PROM. There is no address input; instead, a method to update the ad-
dress by the clock input via the X1 pin is adopted.
Function
Voltage applecation pin for program memory write/verify
(normally V
DD
potential).
Address update clock inputs for program memory write/
verify. Inverse of X1 pin signal is input to X2 pin.
Operating mode selection pin for program memory write/
verify.
8-bit data input/output pins for progrm memory write/
verify.
Supply voltage application pin.
Applies 2.0 to 5.5 V in normal operation, and 6 V for
program memory write/verify.
Pin Name
V
PP
X1, X2
MD0 to MD3
P40 to P43 (low-order 4 bits)
P50 to P53 (high-order 4 bits)
V
DD
4.1
PROGRAM MEMORY WRITE/VERIFY OPERATING MODES
The
PD75P316B assumes the program memory write/verify mode when +6 V and +12.5 V are applied
respectively to the V
DD
and V
PP
pins. The table below shows the operating modes available by the MD0 to MD3
pin setting in this mode. All the remaining pins are at the V
SS
potential by the pull-down resistor.
V
PP
+12.5 V
V
DD
+6 V
MD0
H
L
L
H
MD1
L
H
L
X
MD2
H
H
H
H
MD3
L
H
H
H
Operating Mode
Program memory address zero-clear
Write mode
Verify mode
Program inhibit mode
Operating Mode Setting
X: L or H
PD75P316B
15
4.2
PROGRAM MEMORY WRITING PROCEDURE
The program memory writing procedure is shown below. High-speed write is possible.
(1)
Pull down a pin which is not used to V
SS
via the resistor. The X1 pin is at the low level.
(2)
Supply 5 V to the V
DD
and V
PP
pins.
(3)
10
s wait.
(4)
The program memory address 0 clear mode.
(5)
Supply 6 V and 12.5 V respectively to V
DD
and V
PP
.
(6)
The program inhibit mode.
(7)
Write data in the 1-ms write mode.
(8)
The program inhibit mode.
(9)
The verify mode. If written, proceed to (10); if not written, repeat (7) to (9).
(10) (Number of times written in (7) to (9): X) x 1-ms additional write.
(11) The program inhibit mode.
(12) Update (+1) the program memory address by inputting 4 pulses to the X1 pin.
(13) Repeat (7) to (12) up to the last address.
(14) The program memory address 0 clear mode.
(15) Change the V
DD
and V
PP
pins voltage to 5 V.
(16) Power off.
The diagram below shows the procedure of the above (2) to (12).
Data Input
Data Input
Write
Verify
Additional
Write
Address
Increment
Repeated X Times
Data Output
V
PP
V
PP
V
DD
V
DD
V
DD
+ 1
V
DD
X1
P40-P43
P50-P53
MD0
(P30)
MD1
(P31)
MD2
(P32)
MD3
(P33)
PD75P316B
16
4.3
PROGRAM MEMORY READING PROCEDURE
The
PD75P316B can read the content of the program memory in the following procedure. It reads in the
verify mode.
(1)
Pull down a pin which is not used to V
SS
via the resistor. The X1 pin is at the low level.
(2)
Supply 5 V to the V
DD
and V
PP
pins.
(3)
10
s wait.
(4)
The program memory address 0 clear mode.
(5)
Supply 6 V and 12.5 V respectively to V
DD
and V
PP
.
(6)
The program inhibit mode.
(7)
The verify mode. If clock pulses are input to the X1 pin, data is output sequentially 1 address at a time at
the period of inputting 4 pulses.
(8)
The program inhibit mode.
(9)
The program memory address 0 clear mode.
(10) Change the V
DD
and V
PP
pins voltage to 5 V.
(11) Power off.
The diagram below shows the procedure of the above (2) to (9).
Data Output
Data Output
P40-P43
P50-P53
MD0
(P30)
MD1
(P31)
MD2
(P32)
MD3
(P33)
"L"
V
PP
V
PP
V
DD
V
DD
V
DD
+ 1
V
DD
X1
PD75P316B
17
4.4
ERASURE PROCEDURE (
PD75P316BKK-T ONLY)
The data programmed in the
PD75P316B can be erased by exposure to ultraviolet radiation through the
window in the top of the package.
Erasure is possible using ultraviolet light with a wavelength of approximately 250 nm. The exposure re-
quired for complete erasure is 15 W.s/cm
2
(UV intensity x erasure time).
Erasure takes aproximately 15 to 20 minutes using a commercially available UV lamp (254 nm wavelength,
12 mW/cm
2
intensity).
Note 1.
Program contents may also be erased by extended exposure to direct sunlight or fluorescent light.
The contents should therefore be protected by masking the window in the top of the package with
light-shielding film.
The light-shielding film provided with NEC's UV EPROM products should be used.
2.
Erasure should normally be carried out at a distance of 2.5 cm or less from the UV lamp.
Remarks
The erasure time may be increased due to deterioration of the UV lamp or dirt on the package
window.
18
PD75P316B
5.
ELECTRICAL SPECIFICATIONS
ABSOLUTE MAXIMUM RATINGS (Ta = 25
C)
I
OH
I
OH
*
*
The r.m.s. value should be calculated as follows [R.m.s. value] = [Peak value] x
Duty
Note
Product quality may suffer if the absolute maximum rating is exceeded for even a single parameter, or even
momentarily. In other words, the absolute maximum ratings are rated values at which the product is on the
verge of suffering physical damage, and therefore the product must be used under conditions which ensure
that the absolute maximum ratings are not exceeded.
CAPACITANCE (Ta = 25
C, V
DD
= 0 V)
f=1 MHz
Unmeasured pins returned to 0 V.
PARAMETER
SYMBOL
TEST CONDITIONS
RATING
UNIT
V
DD
0.3 to + 7.0
V
V
I1
Except ports 4 & 5
0.3 to V
DD
+ 0.3
V
V
I2
Ports 4 & 5
0.3 to + 11
V
V
O
0.3 to V
DD
+ 0.3
V
1 pin
15
mA
All pins
30
mA
1 pin
Peak value
30
mA
R.m.s. value
15
mA
Total for ports 0, 2, 3, 5
Peak value
100
mA
R.m.s. value
60
mA
Total for ports 4, 6, 7
Peak value
100
mA
R.m.s. value
60
mA
T
opt
40 to + 85
C
T
stg
65 to + 150
C
Supply voltage
Input voltage
Output voltage
Output current high
Output current low
Operating temperature
Storage temperature
TYP.
MAX.
15
15
15
UNIT
pF
pF
pF
MIN.
PARAMETER
Input capacitance
Output capacitance
I/O capacitance
TEST CONDITIONS
SYMBOL
C
IN
C
OUT
C
IO
19
PD75B316B
MAIN SYSTEM CLOCK OSCILLATOR CHARACTERISTICS (T
a
= 40 to +85
C, V
DD
= 2.0 to 6.0 V)
RESONATOR
Ceramic
resonator*3
Crystal*3
External
clock
UNIT
MHz
ms
MHz
ms
ms
MHz
ns
*
1. The oscillation frequency and X1 input frequency are only indications of the oscillator characteristics. See
the AC characteristics for instruction execution times.
2. The oscillation stabilization time is the time required for oscillation to stabilize after V
DD
reaches the MIN.
value of the oscillation voltage range, or the STOP mode is released.
3. When the oscillation frequency is 4.19 MHz < f
XX
<= 5.0MHz, PCC = 0011 should not be selected as the
instruction execution time. If PCC = 0011 is selected, one machine cycle will be less than 0.95 us, and the MIN.
value of 0.95 us in the specification will not be achieved.
Note
When the main system clock oscillator is used, the following should be noted concerning wiring in the area
in the figure enclosed by a dotted line to prevent the influence of wiring capacitance, etc.
The wiring should be kept as short as possible.
No other signal lines should be crossed. Keep away from lines carrying a high fluctuating current.
The oscillator capacitor grounding point should always be at the same potential as V
DD
. Do not connect
to a ground pattern carrying a high current.
A signal should not be taken from the oscillator.
MAX.
5.0*3
4
5.0*3
10
30
5.0*3
500
TYP.
4.19
MIN.
1.0
1.0
1.0
100
TEST CONDITIONS
After V
DD
has reached MIN.
of oscillation voltage range.
V
DD
=4.5 to 6.0 V
PARAMETER
Oscillation frequency
(f
XX
)*1
Oscillation stabilization
time*2
Oscillation frequency
(f
XX
)*1
Oscillation stabilization
time*2
X1 input frequency
(f
X
)*1
X1 input high-/low-level
width (t
XH
, t
XL
)
RECOMENDED CONSTANT
PD74HCU04
V
DD
V
DD
X2
X1
C1
C2
X2
X1
C1
C2
X2
X1
20
PD75P316B
SUBSYSTEM CLOCK OSCILLATOR CHARACTERISTICS (Ta = 40 to +85
C, V
DD
= 2.0 to 6.0 V)
RECOMENDED CONSTANT
UNIT
kHz
s
s
kHz
s
RESONATOR
Crystal
resonator
External
clock
*
This is the time required for oscillation to stabilize after V
DD
reaches the MIN. value of the oscillation voltage
range.
Note
When the subsystem clock oscillator is used, the following should be noted concerning wiring in the area
in the figure enclosed by a dotted line to prevent the influence of wiring capacitance, etc.
The wiring should be kept as short as possible.
No other signal lines should be crossed. Keep away from lines carrying a high fluctuating current.
The oscillator capacitor grounding point should always be at the same potential as V
DD
. Do not connect
to a ground pattern carrying a high current.
A signal should not be taken from the oscillator.
The subsystem clock oscillator is a low-amplitude circuit in order to achieve a low consumption current,
and is more prone to misoperation due to noise than the main system clock oscillator. Particular care is
therefore required with the wiring method when the subsystem clock is used.
MAX.
35
2
10
100
15
TYP.
1.0
32.768
MIN.
32
32
5
TEST CONDITIONS
V
DD
=4.5 to 6.0 V
PARAMETER
Oscillation frequency
(f
XT
)
Oscillation stabilization
time*
XT1 input frequency
(f
XT
)
XT1 input high-/low-
level width (t
XTH
, t
XTL
)
V
DD
XT2
XT1
C1
C2
R
XT2
XT1
Open
21
PD75B316B
V
DD
1.0
V
Input voltage
high
Input voltage
low
V
OH1
V
OH2
V
DD
2.0
V
Output voltage
high
0.4
V
1.0
V
I
LOH2
V
OUT
= 10 V
20
A
I
LIH3
V
IN
= 10 V
20
A
V
OL2
SB0, 1
0.2 V
DD
V
(1) V
DD
=2.7 to 6.0 V
DC CHARACTERISTICS (Ta = 40 to +85
C, V
DD
= 2.7 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
V
IH1
Ports 2 and 3
0.7 V
DD
V
DD
V
V
IH2
Ports 0, 1, 6, 7 and RESET
0.8 V
DD
V
DD
V
V
IH3
Ports 4 and 5
0.7 V
DD
10
V
V
IH4
X1, X2, XT1
V
DD
0.5
V
DD
V
V
IL1
Ports 2, 3, 4, 5
0
0.3 V
DD
V
V
IL2
Ports 0, 1, 6, 7 and RESET
0
0.2 V
DD
V
V
IL3
X1, X2, XT1
0
0.4
V
V
DD
= 4.5 to 6.0 V
Ports 0, 2, 3, 6, 7,
I
OH
= 1 mA
and BIAS
I
OH
= -100
A
V
DD
0.5
V
V
DD
= 4.5 to 6.0 V
BP0 to BP7
I
OH
= 100
A
(with 2 I
OH
outputs)
I
OH
= 30
A
V
DD
1.0
V
Ports 3, 4, 5
V
DD
= 4.5 to 6.0 V
0.7
2.0
V
I
OL
= 15 mA
Ports
0, 2, 3, 4, 5, 6, 7
V
DD
= 4.5 to 6.0 V
V
OL1
I
OL
= 1.6 mA
I
OL
= 400
A
0.5
V
Opendrain
pull-up resistor
1 k
V
DD
= 4.5 to 6.0 V
BP0 to BP7
I
OL
= 100
A
(with 2 I
OL
outputs)
I
OL
= 50
A
1.0
V
I
L1H1
Other than below
3
A
V
IN
= V
DD
I
LIH2
X1, X2, XT1
20
A
Ports 4 and 5
Input leakage
I
LIL1
Other than below
3
A
current low
V
IN
= 0 V
I
LIL2
X1, X2, XT1
20
A
Output leakage
I
LOH1
V
OUT
= V
DD
Other than below
3
A
current high
Ports 4 and 5
Output leakage
current low
Output voltage
low
Input leakage
current high
I
LOL
V
OUT
= 0 V
3
A
22
PD75P316B
DC CHARACTERISTICS (Ta = 40 to +85
C, V
DD
= 2.7 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Ports 0, 1, 2, 3, 6, 7
V
DD
= 5.0 V
10%
15
40
80
k
R
L
(Except P00)
V
IN
= 0 V
V
DD
= 3.0 V
10%
30
200
k
LCD drive voltage
V
LCD
2.0
V
DD
V
LCD output voltage
deviation*1
V
ODC
I
O
=
5
A
0
0.2
V
(common)
LCD output voltage
deviation
V
ODS
I
O
=
1
A
0
0.2
V
(segment)
V
DD
= 5 V
10%*4
4.0
12
mA
I
DDI
4.19 MHz*3
V
DD
= 3 V
10%*5
0.5
1.5
mA
crystal oscillation
C1 = C2 = 22 pF
HALT
V
DD
= 5 V
10%
1
3
mA
I
DD2
mode
V
DD
= 3 V
10%
300
900
A
I
DD3
V
DD
= 3 V
10%
30
90
A
32 kHz*6
crystal oscillation
HALT
V
DD
= 3 V
10%
mode
V
DD
= 5 V
10%
1
25
A
I
DD5
0.5
15
A
Ta = 25
C
0.5
5
A
* 1.
The voltage deviation is the difference between the output voltage and the ideal value of the common output
(V
LCDn
; n = 0, 1, 2).
2.
Excluding the current flowing in the internal pull-up resistor.
3.
Including the case where the subsystem clock is oscillated.
4.
When the processor clock control register (PCC) is set to 0011 for operation in high-speed mode.
5.
When PCC is set to 0000 for operation in low-speed mode.
6.
When the system clock control register (SCC) is set to 1001, main system clock oscillation is stopped, and
the device is operated on the subsystem clock.
Internal pull-up
resistor
V
LCD0
= V
LCD
V
LCD1
= V
LCD
2/3
V
LCD2
= V
LCD
1/3
2.7 V
V
LCD
V
DD
I
DD4
7
21
A
V
DD
=
3 V
10%
XT1 = 0 V
STOP mode
Supply current*2
23
PD75B316B
t
CY
t
TIH
,
t
TIL
t
INTH
,
t
INTL
t
CY
vs V
DD
(Operating on Main System Clock)
Cycle Time t
CY
[
s]
Supply Voltage V
DD
[V]
0
1
2
3
4
5
6
0.5
1
2
3
4
5
30
64
70
6
Guaranteed
Operation Range
AC CHARACTERISTICS (Ta = 40 to +85
C, V
DD
= 2.7 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Operating on main
V
DD
= 4.5 to 6.0 V
0.95
64
s
system clock
3.8
64
s
Operating on
subsystem clock
TI0 input
V
DD
= 4.5 to 6.0 V
0
1
MHz
frequency
f
TI
0
275
kHz
TI0 input high-/low-
V
DD
= 4.5 to 6.0 V
0.48
s
level width
1.8
s
INT0
*2
s
INT1, 2, 4
10
s
KR0 to KR7
10
s
RESET low-level
t
RSL
10
s
width
114
122
125
s
Interrupt input
high-/low-level
width
* 1.
The CPU clock (
) cycle time (minimum instruc-
tion execution time) is determined by the oscil-
lation frequency of the connected resonator, the
system clock control register (SCC), and the
processor control register (PCC).
The graph on the right shows the characteristic
of the cycle time t
CY
against the supply current
V
DD
in the case of main system clock operation.
2.
2t
CY
or 128/f
X
depending on the setting of the
interrupt mode register (IM0).
CPU clock
cycle time*1
(minimum
instruction
execution time
= 1 machine cycle)
24
PD75P316B
t
SIK2
100
ns
SERIAL TRANSFER OPERATIONS
2-Wired and 3-Wired Serial I/O Modes (SCK ... Internal clock output): (Ta = 40 to +85
C, V
DD
= 2.7 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
V
DD
= 4.5 to 6.0 V
1600
ns
SCK cycle time
t
KCY1
3800
ns
SCK high-/low-level
V
DD
= 4.5 to 6.0 V
t
KCY1
/2-50
ns
width
t
KCY1
/2-150
ns
SI setup time
(to SCK
)
SI hold time
(from SCK
)
SO output
V
DD
= 4.5 to 6.0 V
250
ns
delay time
t
KSO1
from SCK
1000
ns
2-Wired and 3-Wired Serial I/O Modes (SCK ... External clock input): (Ta = -40 to +85
C, V
DD
= 2.7 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
SCK cycle time
V
DD
= 4.5 to 6.0 V
800
ns
t
KCY2
3200
ns
SCK high-/low-level
V
DD
= 4.5 to 6.0 V
400
ns
width
1600
ns
SI setup time
(to SCK
)
SI hold time
(from SCK
)
SO output
V
DD
= 4.5 to 6.0 V
300
ns
delay time
t
KSO2
from SCK
1000
ns
*
R
L
and C
L
are the SO output line load resistance and load capacitance.
t
SIK1
150
ns
t
KSI1
400
ns
t
KL1
t
KH1
t
KSI2
400
ns
t
KL2
t
KH2
*
R
L
= 1 k
,
C
L
= 100 pF
*
R
L
= 1 k
,
C
L
= 100 pF
25
PD75B316B
SBI Mode (SCK ... Internal clock output (Master)): (Ta = 40 to +85
C, V
DD
= 2.7 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
SCK cycle time
V
DD
= 4.5 to 6.0 V
1600
ns
t
KCY3
3800
ns
SCK high-/low-level
V
DD
= 4.5 to 6.0 V
t
KCY3
/2-50
ns
width
t
KCY3
/2-150
ns
SB0, 1 setup time
(to SCK
)
SB0, 1 hold time
(from SCK
)
SB0, 1 output
V
DD
= 4.5 to 6.0 V
0
250
ns
delay time from
t
KSO3
SCK
0
1000
ns
SB0, 1
from SCK
t
KSB
t
KCY3
ns
SCK from SB0, 1
t
SBK
t
KCY3
ns
t
SBL
t
KCY3
ns
t
SBH
t
KCY3
ns
SBI Mode (SCK ... External clock input (Slave)): (Ta = 40 to +85
C, V
DD
= 2.7 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
SCK cycle time
V
DD
= 4.5 to 6.0 V
800
ns
t
KCY4
3200
ns
SCK high-/low-level
V
DD
= 4.5 to 6.0 V
400
ns
width
1600
ns
SB0, 1 setup time
(to SCK
)
SB0, 1 hold time
(from SCK
)
SB0, 1 output
V
DD
= 4.5 to 6.0 V
0
300
ns
delay time from
t
KSO4
SCK
0
1000
ns
SB0, 1
from SCK
t
KSB
t
KCY4
ns
SCK
from SB0, 1
t
SBK
t
KCY4
ns
t
SBL
t
KCY4
ns
t
SBH
t
KCY4
ns
*
R
L
and C
L
are the SB0, 1 output line load resistance and load capacitance.
t
SIK3
150
ns
t
KSI3
t
KCY3
/2
ns
t
KL3
t
KH3
SB0, 1 low-level
width
SB0, 1 high-level
width
t
KSI4
t
KCY4
/2
ns
t
SIK4
100
ns
t
KL4
t
KH4
R
L
= 1 k
,
*
C
L
= 100 pF
R
L
= 1 k
,
*
C
L
= 100 pF
SB0, 1 high-level
width
SB0, 1 low-level
width
26
PD75P316B
(2) V
DD
=2.7 to 6.0 V
DC CHARACTERISTICS (Ta = 40 to +85
C, V
DD
= 2.0 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
V
IH1
Ports 2 and 3
0.8 V
DD
V
DD
V
V
IH2
Ports 0, 1, 6, 7 and RESET
0.8 V
DD
V
DD
V
V
IH3
Ports 4 and 5
0.8V
DD
10
V
V
IH4
X1, X2, XT1
V
DD
0.3
V
DD
V
V
IL1
Ports 2, 3, 4, 5
0
0.2 V
DD
V
V
IL2
Ports 0, 1, 6, 7 and RESET
0
0.2 V
DD
V
V
IL3
X1, X2, XT1
0
0.25
V
Ports 0, 2, 3, 6, 7
and BIAS
BP0 to BP7 (with
2 I
OH
outputs)
Ports 0, 2, 3, 4, 5
6, 7
V
OL1
Opendrain,
pull-up resistor
1 k
BP0 to BP7
(with 2 I
OL
outputs)
I
LIH1
Other than below
3
A
V
IN
= V
DD
I
LIH2
X1, X2, XT1
20
A
Ports 4 and 5
Input leakage
I
LIL1
Other than below
3
A
current low
V
IN
= 0 V
I
LIL2
X1, X2, XT1
20
A
Output leakage
I
LOH1
V
OUT
= V
DD
Other than below
3
A
current high
I
LOH2
V
OUT
= 10 V
Ports 4 and 5
20
A
Output leadage
I
LOL
V
OUT
= 0 V
3
A
current low
Ports 0, 1, 2, 3, 6, 7
R
L
(Except P00)
V
DD
= 2.5 V
10%
50
600
k
V
IN
= 0 V
LCD drive voltage
V
LCD
2.0
V
DD
V
Input voltage
high
Input voltage
low
V
OH2
I
OH
= 10
A
V
DD
0.4
V
V
OH1
I
OH
= 100
A
V
DD
0.5
V
Output voltage
high
I
OL
= 400
A
0.5
V
SB0, 1
0.2 V
DD
V
Output voltage
low
V
OL2
I
OL
= 10
A
0.4
V
Input leakage
current high
I
LIH3
V
IN
= 10 V
20
A
Internal pull-up
resistor
27
PD75B316B
DC CHARACTERISTICS (Ta = 40 to +85
C, V
DD
= 2.0 to 6.0 V)
V
LCDO
= V
LCD
V
LCD1
= V
LCD
2/3
V
LCD2
= V
LCD
1/3
2.0 V
V
LCD
V
DD
4.19 MHz*3
crystal oscillation
C1 = C2 = 22 pF
low-speed mode
32 kHz*5
crystal oscillation
XT1 = 0 V
STOP mode
V
DD
= 2.5 V
10%
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
LCD output voltage
deviation *1
V
ODC
I
O
=
5
A
0
0.2
V
(common)
LCD output
voltage deviation
V
ODS
I
O
=
1
A
0
0.2
V
(segment)
V
DD
= 3 V
10%*4
0.5
1.5
mA
I
DDI
V
DD
= 2.5 V
10%*4
0.4
1.2
mA
HALT
V
DD
= 3 V
10%
300
900
A
I
DD2
mode
V
DD
= 2.5 V
10%
200
600
A
V
DD
= 3 V
10%
40
90
A
I
DD3
Supply current*2
V
DD
= 2.5 V
10%
25
75
A
HALT
V
DD
= 3 V
10%
7
21
A
I
DD4
mode
V
DD
= 2.5 V
10%
4
12
A
0.5
15
A
V
DD
= 3 V
10%
Ta = 25
C
0.5
5
A
I
DD5
0.4
15
A
Ta = 25
C
0.4
5
A
* 1.
The voltage deviation is the difference between the output voltage and the ideal value of the common
output (V
LCDn
; n = 0, 1, 2).
2.
Excluding the current flowing in the internal pull-up resistor.
3.
Including the case where the subsystem clock is oscillated.
4.
When PCC is set to 0000 for operation in low-speed mode.
5.
When the system clock control register (SCC) is set to 1001, main system clock oscillation is stopped, and
the device is operated on the subsystem clock.
28
PD75P316B
1.8
s
3.4
64
s
f
TI
0
275
kHz
t
INTH
,
t
INTL
* 1.
The CPU clock (
) cycle time (minimum instruc-
tion execution time) is determined by the oscil-
lation frequency of the connected resonator,
the system clock control register (SCC), and the
processor clock control register (PCC).
The graph on the right shows the characteristic
of the cycle time t
CY
against the supply current
V
DD
in the case of main system clock operation.
2.
2t
CY
or 128/f
X
depending on the setting of the
interrupt mode register (IMO).
t
CY
vs V
DD
(Operating on Main System Clock)
Cycle Time t
CY
[
s]
Supply Voltage V
DD
[V]
0
1
2
3
4
5
6
0.5
1
2
3
4
5
30
64
70
6
Guaranteed
Operation Range
114
122
125
s
AC CHARACTERISTICS (Ta = 40 to +85
C, V
DD
= 2.0 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
V
DD
= 2.7 to 6.0 V
3.8
64
s
Operating on main
V
DD
= 2.0 to 6.0 V
5
64
s
system clock
t
CY
Ta = 40 to + 60
C
V
DD
= 2.2 to 6.0 V
Operating on
subsystem clock
TI0 input
frequency
TI0 input high-/low-
t
TIH
,
level width
t
TIL
INT0
*2
s
INT1, 2, 4
10
s
KR0 to KR7
10
s
RESET low-level
t
RSL
10
s
width
Interrupt input
high-/low-level
width
CPU clock
cycle time
(minimum instruc-
tion execution time
= 1 machine
cycle)*1
29
PD75B316B
SERIAL TRANSFER OPERATIONS
2-Wired and 3-Wired Serial I/O Mode (SCK ... Internal clock output): (Ta = 40 to +85
C, V
DD
= 2.0 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
SCK cycle time
V
DD
= 4.5 to 6.0 V
1600
ns
t
KCY1
3800
ns
SCK high-/low-
V
DD
= 4.5 to 6.0 V
t
KCY1
/2-50
ns
level width
t
KCY1
/2-150
ns
SI setup time
(to SCK
)
SI hold time
(from SCK
)
SO output
V
DD
= 4.5 to 6.0 V
250
ns
delay time
t
KSO1
from SCK
1000
ns
2-Wired and 3-Wired Serial I/O Mode (SCK ... External clock input): (Ta = 40 to +85
C, V
DD
= 2.0 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
SCK cycle time
V
DD
= 4.5 to 6.0 V
800
ns
t
KCY2
3200
ns
SCK high-/low-
V
DD
= 4.5 to 6.0 V
400
ns
level width
1600
ns
SI setup time
(to SCK
)
SI hold time
(from SCK
)
SO output
V
DD
= 4.5 to 6.0 V
300
ns
delay time
t
KSO2
from SCK
1000
ns
*
R
L
and C
L
are the SO output line load resistance and load capacitance.
t
KSI2
400
ns
t
SIK2
100
ns
t
KL1
t
KH1
t
KSI1
400
ns
t
SIK1
250
ns
R
L
= 1 k
,
C
L
= 100 pF*
t
KL2
t
KH2
R
L
= 1 k
,
C
L
= 100 pF*
30
PD75P316B
t
SIK4
100
ns
t
KSI4
t
KCY4
/2
ns
t
KL4
t
KH4
R
L
= 1 k
,
C
L
= 100 pF*
SBI Mode (SCK ... Internal clock output (Master)): (Ta = 40 to +85
C, V
DD
= 2.0 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
SCK cycle time
V
DD
= 4.5 to 6.0 V
1600
ns
t
KCY3
3800
ns
SCK high-/low-
V
DD
= 4.5 to 6.0 V
t
KCY3
/2-50
ns
level width
t
KCY3
/2-150
ns
SB0, 1 setup
time (to SCK
)
SB0, 1 hold
time (from SCK
)
SB0, 1 output
V
DD
= 4.5 to 6.0 V
0
250
ns
delay time
t
KSO3
from SCK
0
1000
ns
SB0, 1
from SCK
t
KSB
t
KCY3
ns
SCK from SB0, 1
t
SBK
t
KCY3
ns
t
SBL
t
KCY3
ns
t
SBH
t
KCY3
ns
SBI Mode (SCK ... External clock input (Slave)): (Ta = 40 to +85
C, V
DD
= 2.0 to 6.0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
SCK cycle time
V
DD
= 4.5 to 6.0 V
800
ns
t
KCY4
3200
ns
SCK high-/low-
V
DD
= 4.5 to 6.0 V
400
ns
level width
1600
ns
SB0, 1 setup
time (to SCK
)
SB0, 1 hold
time (from SCK
)
SB0, 1
V
DD
= 4.5 to 6.0 V
0
300
ns
output delay
t
KSO4
time from SCK
0
1000
ns
SB0, 1
from SCK
t
KSB
t
KCY4
ns
SCK
from SB0, 1
t
SBK
t
KCY4
ns
t
SBL
t
KCY4
ns
t
SBH
t
KCY4
ns
*
R
L
and C
L
are the SBO, 1 output line load resistance and load capacitance.
t
KSI3
t
KCY3
/2
ns
t
SIK3
250
ns
t
KL3
t
KH3
R
L
= 1 k
,
C
L
= 100 pF*
SB0, 1 low-level
width
SB0, 1 high-level
width
SB0, 1 low-level
width
SB0, 1 high-level
width
31
PD75B316B
X1 Input
1/f
X
t
XL
t
XH
V
DD
-0.5 V
0.4 V
XT1 Input
1/f
XT
t
XTL
t
XTH
V
DD
-0.5 V
0.4 V
TI0
1/f
TI
t
TIL
t
TIH
AC Timing Test Points (Except X1 and XT1 inputs)
Clock Timings
TI0 Timing
0.8 V
DD
0.2 V
DD
0.8 V
DD
0.2 V
DD
Test Points
32
PD75P316B
SCK
t
KCY1
t
KH1
t
KL1
Input Data
Output Data
t
SIK1
t
KSI1
t
KSO1
SI
SO
Serial Transfer Timing
3-wired serial I/O mode:
2-wired serial I/O mode:
t
KSO2
t
KL2
t
KH2
t
KCY2
SCK
SB0,1
t
SIK2
t
KSI2
33
PD75B316B
t
INTL
t
INTH
INT0,1,2,4
KR0-7
t
RSL
RESET
t
KSB
t
KSO3,4
t
SIK3,4
t
KSI3,4
t
KL3,4
t
KH3,4
t
KCY3,4
SCK
SB0,1
t
SBK
Serial Transfer Timing
Bus release signal transfer:
Command signal transfer:
Interrupt Input Timing
RESET Input Timing
t
KSB
t
SBL
t
SBH
t
SBK
t
KSO3,4
t
SIK3,4
t
KSI3,4
t
KL3,4
t
KH3,4
t
KCY3,4
SCK
SB0,1
34
PD75P316B
DATA MEMORY STOP MODE LOW SUPPLY VOLTAGE DATA RETENTION CHARACTERISTICS (Ta = 40 to +85
C)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Data retention supply voltage
V
DDDR
2.0
6.0
V
Data retention supply current*1
I
DDDR
V
DDDR
= 2.0 V
0.3
15
A
Release signal setting time
t
SREL
0
s
Oscillation stabilization
Release by RESET
2
17
/fx
ms
wait time*2
t
WAIT
Release by interrupt request
*3
ms
* 1.
Excluding current flowing in the internal pull-up resistor.
2.
The oscillation stabilization time is the time during which the CPU operation is stopped to prevent unstable
operation when oscillation is started.
3.
Depends on the basic interval timer mode register (BTM) setting ( see table below).
WAIT TIME
BTM3
BTM2
BTM1
BTM0
(Figure in ( ) is for fx = 4.19 MHz)
--
0
0
0
2
20
/fx (Approx. 250 ms)
--
0
1
1
2
17
/fx (Approx. 31.3 ms)
--
1
0
1
2
15
/fx (Approx. 7.82 ms)
--
1
1
1
2
13
/fx (Approx. 1.95 ms)
35
PD75B316B
Data Retention Timing (STOP mode release by RESET)
Data Retention Timing (Standby release signal: STOP mode release by interrupt signal)
STOP Mode
Data Retention Mode
STOP Instruction Execution
V
DD
HALT Mode
Operating
Mode
V
DDDR
t
SREL
t
WAIT
Standby Release Signal
(Interrupt Request)
STOP Mode
Data Retention Mode
STOP Instruction Execution
RESET
V
DD
Internal Reset Operation
HALT Mode
Operating
Mode
V
DDDR
t
SREL
t
WAIT
36
PD75P316B
DC PROGRAMMING CHARACTERISTICS (Ta = 25
5
C, V
DD
= 6.0
0.25 V, V
PP
= 12.5
0.3 V, V
SS
= 0 V)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
V
IH1
Except X1, X2
0.7 V
DD
V
DD
V
V
IH2
X1, X2
V
DD
0.5
V
DD
V
V
IL1
Except X1, X2
0
0.3 V
DD
V
V
IL2
X1, X2
0
0.4
V
I
L1
V
IN
= V
IL
or
V
IH
10
A
V
OH
I
OH
= 1 mA
V
DD
1.0
V
V
OH
I
OL
= 1.6 mA
0.4
V
V
DD
supply
I
DD
30
mA
current
V
DD
supply
I
PP
MD0 = V
IL
, MDI = V
IH
30
mA
current
Note
1. Ensure that V
PP
does not exeed +13.5 V including overshoot.
2. V
DD
must be applied before V
PP
, and cut after V
PP
.
Input voltage
high
Input voltage
low
Input leakage
current
Output voltage
high
Outputvoltage
low
37
PD75B316B
DC PROGRAMMING CHARACTERISTICS (Ta = 25
5
C, V
DD
= 6.0
0.25 V, V
PP
= 12.5
0.3 V, V
SS
= 0 V)
PARAMETER
SYMBOL
*1
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Address setup time*2 (to MD0
)
t
AS
t
AS
2
s
MD1 setup time (to MD0
)
t
M1S
t
OES
2
s
Data setup time (to MD0
)
t
DS
t
DS
2
s
Address hold time*2 (from MD0
)
t
AH
t
AH
2
s
Data hold time (from MD0
)
t
DH
t
DH
2
s
Data output float delay time from MD0
t
DF
t
DF
0
130
ns
V
PP
setup time (to MD3
)
t
VPS
t
VPS
2
s
V
DD
setup time (to MD3
)
t
VDS
t
VCS
2
s
Initial program pulse width
t
PW
t
PW
0.95
1.0
1.05
ms
Additional program pulse width
t
OPW
t
OPW
0.95
21.0
ms
MD0 setup time (to MD1
)
t
MOS
t
CES
2
s
Data output delay time from MD0
t
DV
t
DV
MD0=MD1=V
IL
1
s
MD1 hold time (from MD0
)
t
M1H
t
OEH
2
s
MD1 recovery time (from MD0
)
t
M1R
t
OR
2
s
Program counter reset time
t
PCR
10
s
X1 input high-/low-level width
t
XH
, t
XL
0.125
s
X1 input frequency
f
X
4.19
MHz
Initial mode setting time
t
I
2
s
MD3 setup time (to MD1
)
t
M3S
2
s
MD3 hold time (from MD1
)
t
M3H
2
s
MD3 setup time (to MD0
)
t
M3SR
Program memory read
2
s
Data output delay time from address*2
t
DAD
t
ACC
Program memory read
2
s
Data output hold time from address*2
t
HAD
t
OH
Program memory read
0
130
s
MD3 hold time (from MD0
)
t
M3HR
Program memory read
2
s
Data output float delay time from MD3
t
DFR
Program memory read
2
s
* 1.
Symbol of corresponding
PD27C256A
2.
The internal address signal is incremented by 1 on the 4th rise of the X1 input, and is not connected to a pin.
t
M1H
+t
M1R
50
s
38
PD75P316B
Program Memory Write Timing
t
VPS
t
VDS
t
DS
t
DH
t
1
t
PW
t
M1R
t
M0S
t
PCR
t
M1S
t
M1H
t
M3S
t
M3H
t
OPW
t
DS
t
DV
t
DF
t
AH
t
DH
t
AS
t
XL
t
XH
Data Input
Data Output
Data Input
Data Input
V
DD
V
PP
V
PP
V
DD
V
DD
+ 1
V
DD
X1
P40 - P43
P50 - P53
MD0
MD1
MD2
MD3
Program Memory Read Timing
V
DD
V
PP
V
PP
V
DD
V
DD
+ 1
V
DD
X1
MD0
MD1
MD2
MD3
t
VPS
t
M3SR
t
XH
t
XL
t
HAD
t
DAD
t
1
t
DV
t
M3HR
t
DFR
t
PCR
t
VDS
Data Output
Data Output
P40 - P43
P50 - P53
PD75P316B
39
6.
PACKAGE INFORMATION
A
M
F
B
60
61
40
K
L
80 PIN PLASTIC QFP ( 14)
80
1
21
20
41
G
D
C
detail of lead end
S
Q
P
M
I
H
J
55
N
S80GC-65-3B9-3
ITEM
MILLIMETERS
INCHES
A
B
C
D
F
G
H
I
J
K
L
17.20.4
14.00.2
0.8
0.300.10
0.13
14.00.2
0.6770.016
0.031
0.031
0.005
0.026 (T.P.)
0.551
NOTE
M
N
0.10
0.15
1.60.2
0.65 (T.P.)
0.004
0.006
+0.004
0.003
Each lead centerline is located within 0.13
mm (0.005 inch) of its true position (T.P.) at
maximum material condition.
0.0630.008
0.012
0.551
0.80.2
0.031
P
2.7
0.106
0.6770.016
17.20.4
0.8
+0.009
0.008
Q
0.10.1
0.0040.004
S
3.0 MAX.
0.119 MAX.
+0.10
0.05
+0.009
0.008
+0.004
0.005
+0.009
0.008
PD75P316B
40
80 PIN PLASTIC TQFP (FINE PITCH) ( 12)
ITEM MILLIMETERS
INCHES
I
J
0.5 (T.P.)
0.10
0.004
0.020 (T.P.)
A
NOTE
Each lead centerline is located within 0.10 mm (0.004 inch) of
its true position (T.P.) at maximum material condition.
S
A
14.00.2
0.551 +0.009
0.008
B
12.00.2
0.472 +0.009
0.008
C
12.00.2
0.472 +0.009
0.008
D
14.00.2
0.551 +0.009
0.008
F
G
1.25
1.25
0.049
0.049
H
0.22
0.0090.002
P80GK-50-BE9-4
S
1.27 MAX.
0.050 MAX.
K
1.00.2
0.039 +0.009
0.008
L
0.50.2
0.020 +0.008
0.009
M
0.145
0.0060.002
N
0.10
0.004
P
1.05
0.041
Q
0.050.05
0.0020.002
R
55
55
+0.05
0.04
+0.055
0.045
B
C
D
J
H
I
G
F
P
N
L
K
M
Q
R
detail of lead end
M
61
60
41
40
21
20
1
80
PD75P316B
41
Z
U1
A
T
B
D
C
U
G
F
W
R
S
Q
K
M
I
H
J
X80KW-65A-1
ITEM
MILLIMETERS
INCHES
A
B
C
D
F
G
H
I
J
K
Q
14.00.2
13.6
3.6 MAX.
0.06
13.6
0.5510.008
0.072
0.142 MAX.
0.003
0.024 (T.P.)
0.535
NOTE
R
S
0.825
0.825
0.65 (T.P.)
0.032
0.032
Each lead centerline is located within 0.06
mm (0.003 inch) of its true position (T.P.) at
maximum material condition.
0.018
0.535
T
R 2.0
R 0.079
0.5510.008
14.00.2
1.84
U
9.0
0.354
U1
2.1
0.083
+0.004
0.005
W
Z
0.10
0.004
80
1
0.450.10
0.039
+0.007
0.006
1.00.15
C 0.3
C 0.012
0.750.15
0.030
+0.006
0.007
80 PIN CERAMIC WQFN
PD75P316B
42
7.
RECOMMENDED SOLDERING CONDITIONS
This product should be soldered and mounted under the conditions recommended in the table below.
For details of recommended soldering conditions for the surface mounting type, refer to the information
document "Surface Mount Technology Manual (IEI 1207)".
For soldering methods and conditions other than those recommended below, contact our salesman.
Table 7-1 Recommended Soldering Conditions
PD75P316BGC-3B9: 80-Pin Plastic QFP (
s
s
14 mm)
Soldering Method
Recommended Soldering Conditions
Recommended Condition Symbol
Package peak temperature: 230
C;
Infrared reflow
Duration: 30 sec. max. (at 210
C or above);
IR35-00-1
Number of times: once;
Pin part heating
Pin part temperature: 300
C max.;
Duration: 3 sec. max. (per device side)
PD75P316BGK-
9: 80-Pin Plastic QFP (
s
s
12 mm)
Soldering Method
Recommended Soldering Conditions
Recommended Condition Symbol
Package peak temperature: 235
C;
Duration: 30 sec. max. (at 210
C or above);
Infrared reflow
Number of times: once;
IR35-00-1
Timelimit: 7 days*(thereafter 10 hours prebaking required
at 125
C)
Pin part heating
Pin part temperature: 300
C max.;
Duration: 3 sec. max. (per device side)
*
For the storage period after dry-pack decapsulation, storage conditions are max. 25
C, 65% RH.
Note
Use of more than one soldering method should be avoided (except in the case of pin part heating).
PD75P316B
43
APPENDIX A. DEVELOPMENT TOOLS
The following development tools are available for system development using the
PD75P316B.
Hardware
Soft
ware
IE-75000-R*1
IE-75001-R
IE-7500-R-EM*2
EP-75308BGC-R
EV-9200GC-80
EP-75308BGK-R
EV-9500GK-80
PG-1500
PA-75P316BGC
PA-75P316BGK
IE control program
PG-1500 controller
RA75X relocatable assembler
75X series in-circuit emulator
Emulation board for IE-75000-R and IE-75001-R
Emulation probe for
PD75P316BGC.
Provided with EV-9200GC-80, 80-pin conversion socket.
PD75P316BGK emulation probe.
Provided with EV-9200GK-80, 80-pin conversion socket.
PROM programmer
PD75P316BGC programmer adapter. Connected with PG-1500.
PD75P316BGK programmer adapter. Connected with PG-1500.
Host Machine
PC-9800 series (MS-DOSTM Ver.3.30 to Ver.5.00A*3)
IBM PC/ATTM (PC DOSTM Ver.3.1)
*
1. Maintenance product
2. Not incorporated in the IE-75001-R.
3. The task swap function, which is provided with Ver.5.00/5.00A, is not available with this software.
5
PD75P316B
44
APPENDIX B. RELATED DOCUMENTS
Device Related Documents
Document Name
Document Number
User's Manual
IEM-5016
Instruction Application Table
IEM-994
Application Note
IEM-5035
IEM-5041
75X Series Selection Guide
IF-151
Development Tools Documents
Document Name
Document Number
IE-75000-R/IE-75001-R User's Manual
EEU-846
IE-75000-R-EM User's Manual
EEU-673
EP-75308BGC-R User's Manual
EEU-825
EP-75308BGK-R User's Manual
EEU-838
PG-1500 User's Manual
EEU-651
RA75X Assembler Package User's Manual
Operation
EEU-731
Language
EEU-730
PG-1500 Controller User's Manual
EEU-704
Other Documents
Document Name
Document Number
Package Manual
IEI-635
Surface Mount Technology Manual
IEI-1207
Quality Grande on NEC Semiconductor Device
IEI-1209
NEC Semiconductor Device Reliability & Quality Control
IEM-5068
Electrostatic Discharge(ESD) Test
MEM-539
Semiconductor Devices Quality Guarantee Guide
MEI-603
Microcomputer Related Products Guide Other Manufacturers Volume
MEI-604
*
The contents of the above related documents are subject to change without notice. The latest documents
should be used for design, etc.
Hardware
Soft
ware
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[MEMO]
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights
or other intellectual property rights of NEC Corporation or others.
The devices listed in this document are not suitable for use in aerospace equipment, submarine cables, nuclear
reactor control systems and life support systems. If customers intend to use NEC devices for above applications
or they intend to use "Standard" quality grade NEC devices for applications not intended by NEC, please contact
our sales people in advance.
Application examples recommended by NEC Corporation
Standard :
Computer, Office equipment, Communication equipment, Test and Measurement equipment,
Machine tools, Industrial robots, Audio and Visual equipment, Other consumer products, etc.
Special
:
Automotive and Transportation equipment, Traffic control systems, Antidisaster systems,
Anticrime systems, etc.
M4 92.6
PD75P316B